Characterization of Fowler-Nordheim Tunneling and Temperature Effects in Metal-Oxide-Semiconductor
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Characterization of Fowler-Nordheim Tunneling and Temperature Effects in Metal-Oxide-Semiconductor Structures Using Vertical Optimization
https://doi.org/10.9734/bpi/crpps/v5/3289
#Metal_oxide_semiconductor #fowler_nordheim_tunneling_temperature_effect #FN_parameters_ #mox #msc #ϕB #Vcorr
#simultaneously_extracted #flat_band_voltage_VFB #surface_potential_ψS #vertical_optimization_method